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[测试原理] Fundamental Of Testing On ATE /半导体测试原理 [复制链接]

Rank: 7Rank: 7Rank: 7

发表于 2020-4-12 13:21:24 |显示全部楼层
SoftTest的测试原理行业内基本上无人不知,这份好像是泰瑞达出品的,讲得也非常好,基于ATE的测试原理,要更接近于实际测试应用。

FundamentalOfTestingOnATE.zip (4.34 MB, 下载次数: 963)


1. Introduction to Semiconductor Testing

    Design and manufacturing cycle of anIC

    Semiconductor Companies/Staffs

    ATE – Automated Test Equipment and itscomponents

    Load boards, Probe cards, Handlers, Probers   

2.Project Plan, Specifications and Test Program

    Project/Test Plan – Introduction,Benefits, Requirement, Sample

    Specifications – Design, Test, Device,Sample

    Test Program – Types, Consideration, TestFlow, Binning, Summary

    Common Categories of Test for SemiconductorDevice

    Functional, DC, AC Specifications of Device

3. DC Parameters Test (includingContinuity Test)

     Continuity Test - Concept, Test Method,Sample Datalog

     DC Tests – Concept and Test Method

          Power Supply Current Test (IDD)

          Leakage Test (IIL/IIH)

          IOZL/IOZH, IOS

          VOL/IOL, VOH/IOH

      ATE DC Subsystem - VI Source, DC Meter,DC Matrix, Relay Control

4. DigitalFunctional Test

     ATE Pin Electronics

     Test Concepts – Pattern, Timing, Levels

     IO Signals – Input Signal Generation,Output Signal Compare

     Functional Testing Basic – ExampleVIL/VIH, VOL/VOH

     Test Vectors

5. AC Parameters Test

     AC Timing Tests - Setup Time, Hold Time,Propagation Delay, etc

     ATE Time Measurement Subsystem

     Timing Calibration

6. Introduction toMixed Signal Testing

     Sampling Theory – Nyquist Theorem,Coherency Formula

     Fast Fourier Transform (FFT) – FrequencyDomain Analysis

     Generic Mixed Signal Tester Architecture –AWG and Digitizer

7. ADC and DAC Test

     ADC and DAC Basic

     Static Test – Histogram method  (INL, DNL)

     Dynamic Test – SNR, THD, SINAD

8. Debug Tools andDebugging

     Tools - Datalog, Histogram, Shmoo, PatternDebugger, Waveform Tool

     Trouble-Shooting Techniques  

     

9. Introduction toDesign-For-Testability

     DFT consideration

     Test Approach – AdHoc, Scan (andBoundary Scan), Self-Test (BIST)



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