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[测试机资料] IFLEX/MFLEX测试程序开发基础 [pdf] [复制链接]

Rank: 9Rank: 9Rank: 9

发表于 2012-7-31 21:21:46 |显示全部楼层
IFLEX/MFLEX测试程序开发基础,非常详细地讲解了IGXL测试程序的编写,FLEX测试机电内部结构以及变成方法

FLEX_microFLEX_Programming.part2.rar (7.63 MB, 下载次数: 1084)

FLEX_microFLEX_Programming.part1.rar (7.63 MB, 下载次数: 1155)

FLEX_microFLEX_Programming.part3.rar (7.63 MB, 下载次数: 80, 售价: 1 金钱)

FLEX_microFLEX_Programming.part4.rar (1.05 MB, 下载次数: 77, 售价: 1 金钱)

Training Goal: Develop, debug, and validate a VBT-based continuity test
for the 74ALS2454
Class Outline:
– Introduction to the Hardware
• Test System Overview
• Tester Instruments Overview
• Test Head and Device Interface Board (DIB) Slot Orientation
– Introduction to the IG-XL Interface
• Using IG-XL Workbooks (Pin Map, Channel Map, Flow Table, and Test Instance
Worksheets)
• Program Validation
– Introduction to Visual Basic for Test (VBT) Code
• Visual Basic Development and Debug Environment
• Running a Test Program
– Introduction to DCVI and HSD200 Digital Instruments (single function)
• HSD200 PPMU Instrument
• PPMU and Basic DCVI Programming
• IG-XL Help
• Training Goal: Develop, debug, and validate a VBT-based continuity test
for the 74ALS2454
• Supporting Labs:
– DataTool
– Pin Map/Channel Map
– Validation
• Mandatory Lab:
– IG-XL Help
– Continuity Test in VBT (Ti245)
• Optional Labs:
– Test Debug Environment Lab (Continuity)
– VBT Step Through Lab
• Training Goal: Develop, debug, and validate a VBT-based pattern-driven
functional test for the 74ALS245.
• Class Outline:
– Introduction to the HSD200 Instrument
• HSD200 Instrument Hardware Overview
– Programming Data, Timing, Edges, Formats, and Levels (Interface & Code)
• HSD200 Programming Data, Timing, Edges, and Formats: Time Sets (Basic)
Worksheet
• HSD200 Programming Levels: Pin Levels Worksheet
• HSD200 Programming in VBT
– Pattern File Creation, Debugging, Forward and Reverse Compile,
Loading/Unloading (Interface)
• ASCII Pattern File
• Pattern Microcode and Flags
• Compiling/Reverse Compile ASCII Pattern Files
• Creating a Pattern in the PatternTool
• PatternTool Debug
• Loading and Unloading Patterns
– DCVI Supporting Function (Handled in Labs)
• Training Goal: Develop, debug, and validate a VBT-based pattern-driven
functional test for the 74ALS245.
• Supporting Lab:
– Pattern Creation
• Mandatory Labs:
– Functional Test (Ti245)
– PatternTool & HRAM - Test Debug Environment
– Multi-site
• Optional Lab:
– ICC Static Test in VBT (Ti245)
– Sequential Leakage test in VBT (Ti245)
– ICC Dynamic Test in VBT (Ti245)
• Training Goal: Develop, debug, and validate a VBT-based pattern-driven
DSSC simulated serial register write/read test using the 74ALS245 A1
Æ B1 transmission path.
• Class Outline:
– Digital Signal Source Capture (DSSC) Instrument
• DSSC Introduction
– DSCC Pattern Requirements (Interface)
• DSSC Patterns
• ASCII Syntax for DSSC Patterns
– DSSC VBT Programming (Code)
• Signals* DSSC Programming in VBT
– DSSC Debug Displays (Interface)
– Introducing GLOBAL, DC and AC Spec Sheets (Interface)
• Specification Worksheets Orientation* (Global, DC and AC Specs Worksheets)
• Training Goal: Develop, debug, and validate a VBT-based pattern-driven
DSSC simulated serial register write/read test using the Ti245 A1 Æ B1
transmission path.
• Mandatory Lab:
– Simulated Serial Register Read/Write test (DSSC)
• Optional Labs:
– Spec Sheets
– ICC Spec (Ti245)


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